Investigating ripple pattern formation and damage profiles in Si and Ge induced by 100 keV Ar⁺ ion beam: a comparative study

• Indra Sulania,
• Harpreet Sondhi,
• Tanuj Kumar,
• Sunil Ojha,
• G R Umapathy,
• Ambuj Mishra,
• Ambuj Tripathi,
• Richa Krishna,
• Devesh Kumar Avasthi and
• Yogendra Kumar Mishra

Beilstein J. Nanotechnol. 2024, 15, 367–375, doi:10.3762/bjnano.15.33

• clustering of defects leads to a subsequent increase of the damage peak in irradiated samples (for an ion fluence of ≈9 × 1017 ions/cm2) compared to that in unirradiated samples. Keywords: atomic force microscopy; ion beam; nanopatterns; radiation damage; Rutherford backscattering spectrometry; transmission

• provided relevance and connections between experiments and theoretical modelling [4][17][18][19][20][21][22][23][24]. Basic models to explain IBS were initially given by Thompson et al. [25] and Sigmund et al. [26], based on the radiation damage in bulk materials. When an energetic ion strikes a target

Ion beam processing of DNA origami nanostructures

• Leo Sala,
• Agnes Zerolová,
• Violaine Vizcaino,
• Alain Mery,
• Alicja Domaracka,
• Hermann Rothard,
• Philippe Boduch,
• Dominik Pinkas and
• Jaroslav Kocišek

Beilstein J. Nanotechnol. 2024, 15, 207–214, doi:10.3762/bjnano.15.20

• them in procedures based on direct ion beam exposure has so far been avoided because of concerns regarding uncontrollable radiation damage to these soft matter nanostructures. The induction of strand breaks by the direct and indirect effects of ionizing radiation on DNA is a well-known fact [14][15

A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope

• Frances I. Allen

Beilstein J. Nanotechnol. 2021, 12, 633–664, doi:10.3762/bjnano.12.52

The preparation temperature influences the physicochemical nature and activity of nanoceria

• Robert A. Yokel,
• Wendel Wohlleben,
• Johannes Georg Keller,
• Matthew L. Hancock,
• Jason M. Unrine,
• D. Allan Butterfield and
• Eric A. Grulke

Beilstein J. Nanotechnol. 2021, 12, 525–540, doi:10.3762/bjnano.12.43

• component, including cancer, radiation damage, bacterial infection, sepsis, wounds, stroke-induced ischemia, retinal degeneration, and neurodegenerative diseases [10]. Other reviews provide more information on nanoceria synthesis methods and the resulting physicochemical properties of the products as well

Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams

• Serguei Chiriaev,
• Luciana Tavares,
• Vadzim Adashkevich,
• Arkadiusz J. Goszczak and
• Horst-Günter Rubahn

Beilstein J. Nanotechnol. 2020, 11, 1693–1703, doi:10.3762/bjnano.11.151

• materials over the entire depth of their penetration path in a target. In our recent work [4], we demonstrated that, in addition to the direct surface patterning by the abovementioned techniques, the radiation damage generated by He+ FIB in the bulk of poly(methyl methacrylate) (PMMA) substrates can be used

• polymer bulk [7]. In fact, the method utilizes ion energy losses to manipulate the surface morphology by means of radiation damage generated in the substrate bulk and minimizes the surface damage resulting from sputtering. This leaves the thin films and the prefabricated thin-film nanostructures on the

• -resolution imaging with a He+ ion-beam probe was performed using a very small beam current (below 0.1 pA) to minimize imaging artifacts from radiation damage generated by the probe beam. (a) AFM image and (b) the corresponding depth profile of a fragment of the surface depression produced in a 5 nm Pt60Pd40

Involvement of two uptake mechanisms of gold and iron oxide nanoparticles in a co-exposure scenario using mouse macrophages

• Dimitri Vanhecke,
• Dagmar A. Kuhn,
• Dorleta Jimenez de Aberasturi,
• Sandor Balog,
• Ana Milosevic,
• Dominic Urban,
• Diana Peckys,
• Niels de Jonge,
• Wolfgang J. Parak,
• Alke Petri-Fink and
• Barbara Rothen-Rutishauser

Beilstein J. Nanotechnol. 2017, 8, 2396–2409, doi:10.3762/bjnano.8.239

• pixel-dwell times between 30 and 100 μs were used. The image sizes were 2048 × 1768 or 1024 × 884 pixels. The electron dose for an image ranged between 81 and 376 e−/Å2, and was below the limit of radiation damage [49]. Transmission electron microscopy Fixation was carried out with 2.5% glutaraldehyde

Structural properties and thermal stability of cobalt- and chromium-doped α-MnO₂ nanorods

• Romana Cerc Korošec,
• Polona Umek,
• Alexandre Gloter,
• Jana Padežnik Gomilšek and
• Peter Bukovec

Beilstein J. Nanotechnol. 2017, 8, 1032–1042, doi:10.3762/bjnano.8.104

• ). The measured spectra show no signs of radiation damage of the samples: subsequent spectra measured at the same spot are, except for the noise, identical to the first one. No change in the oxidation state or in the structure is detected. The summed spectra are used for further analysis. Figure 5 shows

Obtaining and doping of InAs-QD/GaAs(001) nanostructures by ion beam sputtering

• Sergei N. Chebotarev,
• Alexander S. Pashchenko,
• Leonid S. Lunin,
• Elena N. Zhivotova,
• Georgy A. Erimeev and
• Marina L. Lunina

Beilstein J. Nanotechnol. 2017, 8, 12–20, doi:10.3762/bjnano.8.2

• oxide films containing adsorbed impurities. The described way of cleaning the targets cannot be used for the pre-treatment of single-crystal substrates because of possible radiation damage. For this purpose, we used the procedure described in [28]. Pre-growth annealing of the prepared substrate in the

Case studies on the formation of chalcogenide self-assembled monolayers on surfaces and dissociative processes

• Yongfeng Tong,
• Tingming Jiang,
• Azzedine Bendounan,
• Makri Nimbegondi Kotresh Harish,
• Angelo Giglia,
• Stefan Kubsky,
• Fausto Sirotti,
• Luca Pasquali,
• Srinivasan Sampath and
• Vladimir A. Esaulov

Beilstein J. Nanotechnol. 2016, 7, 263–277, doi:10.3762/bjnano.7.24

• be expected from the model of Carro et al.) [88]. An important aspect in XPS analysis is potential radiation damage to molecular films. This was carefully checked and was found not to affect the above conclusions (see original publication [48] for details). In a final twist in this investigation, we

Counterion effects on nano-confined metal–drug–DNA complexes

• Nupur Biswas,
• Sreeja Chakraborty,
• Alokmay Datta,
• Munna Sarkar,
• Mrinmay K. Mukhopadhyay,
• Mrinal K. Bera and
• Hideki Seto

Beilstein J. Nanotechnol. 2016, 7, 62–67, doi:10.3762/bjnano.7.7

• shifted to energy 11.736 keV which corresponds to wavelength 1.08 Å. To avoid radiation damage the sample was kept in nitrogen atmosphere. To analyse all XRR data we have used Minpack fitting package [20] based on Levenberg–Marquardt algorithm. It provides the local minimum of nonlinear least squares

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

• Xiaoxing Ke,
• Carla Bittencourt and
• Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

• . Nevertheless, the delocalization can be used to carry out “remote” spectroscopy by positioning the electron beam outside the sample and virtually “probe” the material, as demonstrated on vibrational spectroscopy acquired from various materials, both hard and soft [31]. Radiation damage can therefore be avoided

Overview of nanoscale NEXAFS performed with soft X-ray microscopes

• Peter Guttmann and
• Carla Bittencourt

Beilstein J. Nanotechnol. 2015, 6, 595–604, doi:10.3762/bjnano.6.61

• nanostructures needs spatial resolution in the nanoscale range together with X-ray spectroscopy methods. X-ray microscopy reaches a higher Rayleigh resolution than optical microscopy as the resolution is decreasing linear with the wavelength. Additionally, the larger penetration depth and smaller radiation

• damage compared to electron microscopy has to be noted. Atmospheric pressure operation using a helium atmosphere is possible [13]. Electronic properties of samples can be studied due to the interaction of X-ray with matter. Therefore, the combination of X-ray microscopy and spectroscopy denominated X-ray

UHV deposition and characterization of a mononuclear iron(III) β-diketonate complex on Au(111)

• Irene Cimatti,
• Silviya Ninova,
• Valeria Lanzilotto,
• Luigi Malavolti,
• Luca Rigamonti,
• Brunetto Cortigiani,
• Matteo Mannini,
• Elena Magnano,
• Federica Bondino,
• Federico Totti,
• Andrea Cornia and
• Roberta Sessoli

Beilstein J. Nanotechnol. 2014, 5, 2139–2148, doi:10.3762/bjnano.5.223

• ][38][39]. From these data the XMCD signal can be extracted as the difference (σ− − σ+). Similarities between the presented XMCD spectra, featuring the largest intensity at 709.1 eV, and those reported for the Fe4 family of molecules [13][14][40] are evident thus excluding radiation damage for Fe(dpm)3

CoPc and CoPcF₁₆ on gold: Site-specific charge-transfer processes

• Fotini Petraki,
• Heiko Peisert,
• Johannes Uihlein,
• Umut Aygül and
• Thomas Chassé

Beilstein J. Nanotechnol. 2014, 5, 524–531, doi:10.3762/bjnano.5.61

• (111) [27]. However, the increase of the distance of fluorine on these systems is less than 0.03 nm and thus the expected change of the polarization screening is rather small (less than 0.08 eV [19]). Also, we rule out radiation damage since the shape of the Carbon 1s XPS spectrum is independent on the

Radiation-induced nanostructures: Formation processes and applications

• Michael Huth

Beilstein J. Nanotechnol. 2012, 3, 533–534, doi:10.3762/bjnano.3.61

• . Different processes, such as dissociative electron attachment, neutral dissociation or dissociative ionization act together in breaking selected bonds in (mostly) metal–organic precursor molecules. On the other hand, low-energy electrons also play a role in the radiation damage induced by ionizing radiation